Rapid multiplex ultrafast nonlinear microscopy for material characterization

We demonstrate rapid imaging based on four-wave mixing (FWM) by assessing the quality of advanced materials through measurement of their nonlinear response, exciton dephasing, and exciton lifetimes. We use a WSe\(_2\) monolayer grown by chemical vapor deposition as a canonical example to demonstrate...

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Bibliographic Details
Published in:arXiv.org 2022-08
Main Authors: Purz, Torben L, Hipsley, Blake T, Martin, Eric W, Ulbricht, Ronald, Cundiff, Steven T
Format: Article
Language:English
Subjects:
Chemical vapor deposition
Excitons
Four-wave mixing
Nonlinear response
Optical microscopy
Quality assessment
Room temperature
White light
Online Access:Get full text
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Summary:We demonstrate rapid imaging based on four-wave mixing (FWM) by assessing the quality of advanced materials through measurement of their nonlinear response, exciton dephasing, and exciton lifetimes. We use a WSe\(_2\) monolayer grown by chemical vapor deposition as a canonical example to demonstrate these capabilities. By comparison, we show that extracting material parameters such as FWM intensity, dephasing times, excited state lifetimes, and distribution of dark/localized states allows for a more accurate assessment of the quality of a sample than current prevalent techniques, including white light microscopy and linear micro-reflectance spectroscopy. We further discuss future improvements of the ultrafast FWM techniques by modeling the robustness of exponential decay fits to different spacing of the sampling points. Employing ultrafast nonlinear imaging in real-time at room temperature bears the potential for rapid in-situ sample characterization of advanced materials and beyond.
ISSN:2331-8422
DOI:10.48550/arxiv.2208.06633