Effects of weave path parameters on the geometry of wire arc additive manufactured features

The present work investigates the effect of process parameters on the geometry of wire arc additive manufactured parts. The geometric accuracy of features produced with a weaving strategy is compared to what can be accomplished with a typical overlapping bead strategy. In this work, single-layer and...

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Bibliographic Details
Published in:International journal of advanced manufacturing technology 2023-02, Vol.124 (7-8), p.2563-2577
Main Authors: Bultman, Jacob, Saldaña, Christopher
Format: Article
Language:English
Subjects:
Additive manufacturing
Advanced manufacturing technologies
Amplitudes
Arc deposition
Beads
CAE) and Design
Computer-Aided Engineering (CAD
Engineering
Experiments
Geometric accuracy
Geometry
Heat
Industrial and Production Engineering
Mechanical Engineering
Media Management
Monolayers
Multilayers
Optical microscopy
Original Article
Process parameters
Tensile strength
Weaving
Wire
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Summary:The present work investigates the effect of process parameters on the geometry of wire arc additive manufactured parts. The geometric accuracy of features produced with a weaving strategy is compared to what can be accomplished with a typical overlapping bead strategy. In this work, single-layer and multi-layer geometries were deposited under varying process and path parameters. The wavelength, amplitude, and torch speed of the weaving path were varied, while the power, wire feed speed, and contact tip to work distance remained constant. The geometric deposition efficiencies of several samples produced with a weave strategy are directly compared to samples generated with two parallel overlapping beads with torch speeds defined to match the deposition rate of the weave samples. Feature geometries were characterized using optical microscopy and laser scanning data. The results indicate that implementing a weave path strategy can improve the geometric accuracy of wire arc additive features, thus increasing the effective volumetric deposition rate of the process. It is shown that the most consistent improvements resulted from the combination of low wavelength and high amplitude, which correlate to wider and taller printed layers.
ISSN:0268-3768
1433-3015
DOI:10.1007/s00170-022-10546-z