Highly \({ }^{28} \mathrm{Si}\) Enriched Silicon by Localised Focused Ion Beam Implantation

• Published in: arXiv.org 2023-08
• Main Authors: Acharya, Ravi, Maddison Coke, Mason Adshead, Li, Kexue, Barat Achinuq, Cai, Rongsheng, A Baset Gholizadeh, Jacobs, Janet, Boland, Jessica L, Haigh, Sarah J, Moore, Katie L, Jamieson, David N, Curry, Richard J
• Format: Article
• Language: English
• Subjects: Circuits; Crystallization; Enrichment; Ion beams; Ion implantation; Ion sources; Irradiation; Nuclear spin; Quantum computing; Qubits (quantum computing); Secondary ion mass spectrometry; Silicon; Silicon wafers; Solid phases; Wafers
• ISSN: 2331-8422

Solid-state spin qubits within silicon crystals at mK temperatures show great promise in the realisation of a fully scalable quantum computation platform. Qubit coherence times are limited in natural silicon owing to coupling to the isotope \({ }^{29} \mathrm{Si}\) which has a non-zero nuclear spin. This work presents a method for the depletion of \({ }^{29} \mathrm{Si}\) in localised volumes of natural silicon wafers by irradiation using a 45 keV \({ }^{28} \mathrm{Si}\) focused ion beam with fluences above \(1 \times 10^{19} \, \mathrm{ions} \, \mathrm{cm}^{-2}\). Nanoscale secondary ion mass spectrometry analysis of the irradiated volumes shows unprecedented quality enriched silicon that reaches a minimal residual \({ }^{29} \mathrm{Si}\) value of 2.3 \(\pm\) 0.7 ppm and with residual C and O comparable to the background concentration in the unimplanted wafer. Transmission electron microscopy lattice images confirm the solid phase epitaxial re-crystallization of the as-implanted amorphous enriched volume extending over 200 nm in depth upon annealing. The ease of fabrication, requiring only commercially available natural silicon wafers and ion sources, opens the possibility for co-integration of qubits in localised highly enriched volumes with control circuitry in the surrounding natural silicon for large-scale devices.