Characterization of X-MET8000 handheld XRF spectrometer for metal alloys analysis

• Main Authors: Karthika, Risky Nurseila, Trikasjono, Toto, Umami, Ida Ukhriza
• Format: Conference Proceeding
• Language: English
• Subjects: Alloying elements; Chi-square test; Chromium; Copper; Heavy metals; Manganese; Mathematical analysis; Portable equipment; Specifications; Stability; Time measurement; X ray fluorescence analysis
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/5.0173167

X-ray Fluorescence (XRF) is an analytical technique for the detection and quantification of heavy metals, widely used in portable devices which are basically designed for metal alloys. The Nuclear Instrumentation Laboratory of the Indonesian Polytechnic of Nuclear Technology has a material analyzer, X-MET8000 handheld XRF spectrometer which has not been used optimally in its utilization. A quality laboratory must be able to provide reliable and valid data. To ensure the reliability of the data from the analysis of a laboratory and to support the application of the Indonesian National Standard (SNI) No19-17025-2005, a validation of the analytical method is required. This study aims to determine the characterization of spectrometer. The resolution is obtained by calculating the FWHM (Full Width Half Maximum) value. The accuracy measured by comparing the element Cr (Chromium), Ni (Nickel), Mn (Manganese) and Cu (Copper) percentage listed on the Certificate of Analysis 3063753 (batch C) from MBH Analytical Ltd to the measurement element value. The precision test of the instrument expressed in Relative Standard Deviation (% RSD). This study also determine the stability of spectrometer using chi square, then to obtain the correlation between the measurement time of the detected element using metal alloys samples. Based on the result study, the X-MET8000 XRF spectrometer has a detector resolution of 1.645% with a FWHM of 96.9 eV and still in good range according to specifications. The stability result was tested using the chi square test with a significance level of 0.05 and 29 degrees of freedom and was declared stable with χ^2is 18.64 as required (17.71 – 42.56). X-MET8000 handheld XRF spectrometer can be used for quantitative analysis of metal alloys with a measurement accuracy value more than 97% and a precision value of 0.3455% as required by the specification and ASTM E876-89. It also obtained the correlation between the measurement time of the detected element using metal alloys. Therefore, it can be a preliminary study to complete references related to element testing using handheld XRF.