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Tunable diodes made by atomically thin lateral heterojunction
A diode is a fundamental electronic device with rectification characteristics and controls the flow of current in one direction. Atomically thin diodes made by two-dimensional (2D) materials are proven to shrink diodes’ sizes down to atomic scale, but lattice mismatching at the interfaces between co...
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Published in: | Science China materials 2023-11, Vol.66 (11), p.4419-4426 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | A diode is a fundamental electronic device with rectification characteristics and controls the flow of current in one direction. Atomically thin diodes made by two-dimensional (2D) materials are proven to shrink diodes’ sizes down to atomic scale, but lattice mismatching at the interfaces between component materials impedes their rectification performances. Here we report a high-performance diode of Sn
x
Mo
1−
x
S
2
/MoS
2
lateral heterostructures fabricated
via
one-step chemical vapor deposition technique. Sn atoms are selectively doped at the edges of MoS
2
crystals to form Sn
x
Mo
1−
x
S
2
that have the same lattice constant with respect to that of MoS
2
. Schottky barriers are formed by depositing gold contacts on Sn
x
Mo
1−
x
S
2
and MoS
2
crystals but with distinct barriers’ heights, which leads to primary transport of charge carriers in one direction. By controlling the doping concentration and electrical gate voltage (
V
g
), we tune the alignment of Fermi level between MoS
2
and Sn
x
Mo
1−
x
S
2
, and achieve adjustable rectification ratio up to 10
4
(
I
3 V
/
I
−3 V
,
V
g
= 60 V). Impressively, the diode also exhibits excellent photovoltaic and self-powered photo-detective applications. The heterojunction diode exhibits high responsivity of 0.16 A W
−1
and detectivity of 6.4 × 10
10
Jones under 650 nm laser illumination. Our work provides a potential pathway for constructing (onto)electronic circuits of 2D materials. |
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ISSN: | 2095-8226 2199-4501 |
DOI: | 10.1007/s40843-023-2586-9 |