Single‐Shot Wavefront Sensing with Nonlocal Thin Film Optical Filters

Conventional wavefront sensors suffer from the fundamental limitation of the space‐bandwidth product and have a trade‐off between their spatial sampling interval and dynamic range. Here, nonlocal thin film optical filters with optimized angle‐ and polarization‐dependent responses are leveraged to ci...

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Bibliographic Details
Published in:Laser & photonics reviews 2023-12, Vol.17 (12), p.n/a
Main Authors: Li, Liu, Jia, Wenhe, Jin, Chunqi, Wang, Shuai, Shen, Zicheng, Yang, Yuanmu
Format: Article
Language:English
Subjects:
Dynamic range
Electromagnetic wave filters
Image reconstruction
Incident light
inverse design
Luminous intensity
Multilayers
nonlocal filters
Optical filters
Polarization
Polarized light
Sampling
Thin films
Wave front reconstruction
Wave front sensors
Wave fronts
wavefront sensing
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Summary:Conventional wavefront sensors suffer from the fundamental limitation of the space‐bandwidth product and have a trade‐off between their spatial sampling interval and dynamic range. Here, nonlocal thin film optical filters with optimized angle‐ and polarization‐dependent responses are leveraged to circumvent the fundamental limitation, and a robust single‐shot wavefront sensing system with a small spatial sampling interval of 6.9 µm and a large angular dynamic range of 15° is realized. The system only requires inserting two multilayer dielectric filters, fabricated using a mature thin film deposition technique, into a conventional 4‐f imaging apparatus. The polarization‐sensitive nonlocal filters are used to map the 2D phase gradients of the incident light field to the intensity variation of the x‐ and y‐polarized light, respectively, thus enabling single‐shot 2D wavefront reconstruction from images taken by a polarization camera. Such a system may be used for a variety of applications, including high‐resolution image aberration correction, surface metrology, and quantitative phase imaging. A new type of single‐shot wavefront sensing system based on nonlocal thin film optical filters is demonstrated, with an extremely small spatial sampling interval of 6.9 µm and a large angular dynamic range of 15°. Such a system may be used for a variety of applications, including high‐resolution image aberration correction, surface metrology, and quantitative phase imaging.
ISSN:1863-8880
1863-8899
DOI:10.1002/lpor.202300426