Electrothermal analyses in Cu/ZrO2/Pt CBRAM memory using a dual-phase-lag model

We have investigated the electrothermal behavior in Cu/ZrO 2 /Pt conductive bridge random access memory (CBRAM) memory based on the dual-phase-lag thermal model. We have studied the effects of the geometry of the conductive filament (CF) and of the applied voltage on the distribution of both the int...

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Bibliographic Details
Published in:Journal of computational electronics 2022-08, Vol.21 (4), p.792-801
Main Authors: Jemii, Elassaad, Belkhiria, Maissa, Aouaini, Fatma, Echouchene, Fraj, Alyousef, Haifa
Format: Article
Language:English
Subjects:
Delay time
Electric fields
Electrical Engineering
Electrodes
Electrolytes
Engineering
Finite element method
Fourier law
Geometry
Heat
Mathematical and Computational Engineering
Mathematical and Computational Physics
Mechanical Engineering
Nonlinear equations
Optical and Electronic Materials
Phase lag
Random access memory
Response time
Temperature
Theoretical
Thermal analysis
Zirconium dioxide
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Summary:We have investigated the electrothermal behavior in Cu/ZrO 2 /Pt conductive bridge random access memory (CBRAM) memory based on the dual-phase-lag thermal model. We have studied the effects of the geometry of the conductive filament (CF) and of the applied voltage on the distribution of both the internal temperature and of the electric field at different delay times. The simulated results are compared with recently published works using classical Fourier’s law. This dual-phase-lag (DPL) model reveals that along the CF during the reset process, the temperatures are lower than those found using Fourier's law in the transient state and increase the reached time of the steady state. Further, the displacement of the hot spot over time is almost negligible relatively to Fourier's law. This study shows that the DPL model may be more useful in assessing the thermoelectric behavior and nanoscale mathematical design of CBRAM memory. Finally, in the computational stage, the finite element method was applied to solve the nonlinear equations.
ISSN:1569-8025
1572-8137
DOI:10.1007/s10825-022-01907-8