Loading…

A Low-Latency Approach for RFF Identification in Open-Set Scenarios

Radio frequency fingerprint (RFF) identification represents a promising technique for lightweight device authentication. However, current research on RFF primarily focuses on the close-set recognition assumption. Moreover, the high computational complexity and excessive latency during the identifica...

Full description

Saved in:
Bibliographic Details
Published in:Electronics (Basel) 2024-01, Vol.13 (2), p.384
Main Authors: Zhang, Bo, Zhang, Tao, Ma, Yuanyuan, Xi, Zesheng, He, Chuan, Wang, Yunfan, Lv, Zhuo
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Radio frequency fingerprint (RFF) identification represents a promising technique for lightweight device authentication. However, current research on RFF primarily focuses on the close-set recognition assumption. Moreover, the high computational complexity and excessive latency during the identification stage represent an intolerable burden for Internet of Things (IoT) devices. In this paper, we propose a deep-learning-based RFF identification framework in relation to open-set scenarios. Specifically, we leverage a simulated training scheme, in which we strategically designate certain devices as simulated unknowns. This allows us to fine-tune our extractor to better handle open-set recognition. Additionally, we construct an exemplar set that only contains representative RFF features to further reduce time consumption in the identification stage. The experiments are carried out on a hardware platform involving LoRa devices and using a USRP N210 software-defined radio receiver. The results show that the proposed framework can achieve 90.23% accuracy for rogue device detection and 93.85% accuracy for legitimate device classification. Furthermore, it is observed that using an exemplar set consisting of half the total data size can reduce the time overhead by 58% compared to using the entire dataset.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics13020384