Estimation of Temperature Homogeneity in MEMS‐Based Heating Nanochips via Quantitative HAADF‐STEM Tomography

• Published in: Particle & particle systems characterization 2024-02, Vol.41 (2), p.n/a
• Main Authors: Chen, Qiongyang, Skorikov, Alexander, Hoeven, Jessi E. S., Blaaderen, Alfons, Albrecht, Wiebke, Pérez‐Garza, H. Hugo, Bals, Sara
• Format: Article
• Language: English
• Subjects: alloying dynamics; Bimetals; fast HAADF‐STEM tomography; Gold; Heating; Homogeneity; in situ microheater; Mechanical systems; Nanomaterials; Nanoparticles; Sample holders; Scanning transmission electron microscopy; temperature distribution; Thermodynamic properties; Tomography; Transmission electron microscopy
• ISSN: 0934-0866; 1521-4117
• DOI: 10.1002/ppsc.202300070

Sample holders for transmission electron microscopy (TEM) based on micro‐electro‐mechanical systems (MEMS) have recently become popular for investigating the behavior of nanomaterials under in situ or environmental conditions. The accuracy and reproducibility of these in situ holders are essential to ensure the reliability of experimental results. In addition, the uniformity of an applied temperature trigger across the MEMS chip is a crucial parameter. In this work, it is measured the temperature homogeneity of MEMS‐based heating sample supports by locally analyzing the dynamics of heat‐induced alloying of Au@Ag nanoparticles located in different regions of the support through quantitative fast high‐angle annular dark‐field scanning TEM tomography. These results demonstrate the superior temperature homogeneity of a microheater design based on a heating element shaped as a circular spiral with a width decreasing outwards compared to a double spiral‐shaped designed microheater. The proposed approach to measure the local temperature homogeneity based on the thermal properties of bimetallic nanoparticles will support the future development of MEMS‐based heating supports with improved thermal properties and in situ studies where high precision in the temperature at a certain position is required. This schematic delineates an approach to quantifying potential localized temperature deviation within a nanochip. Employing two comparable nanoparticles as thermal probes in discrete nanochip regions, the alloying kinetics of these nanoparticles are monitorable using in situ quantitative high‐angle annular dark‐field scanning transmission electron microscopy (HAADF‐STEM) tomography, thus enabling the precise estimation of local temperature deviations.