Extreme ultraviolet lithography reaches 5 nm resolution

• Published in: Nanoscale 2024-08, Vol.16 (33), p.15533-15543
• Main Authors: Giannopoulos, Iason, Mochi, Iacopo, Vockenhuber, Michaela, Ekinci, Yasin, Kazazis, Dimitrios
• Format: Article
• Language: English
• Subjects: CMOS; Diffraction efficiency; Diffraction patterns; Extreme ultraviolet radiation; Industrial research; Lithography; Mass production; Numerical aperture; Photons; Wavelengths
• ISSN: 2040-3364; 2040-3372; 2040-3372
• DOI: 10.1039/d4nr01332h

Extreme ultraviolet (EUV) lithography is the leading lithography technique in CMOS mass production, moving towards the sub-10 nm half-pitch (HP) regime with the ongoing development of the next generation high numerical aperture (high NA) EUV scanners. Hitherto, EUV interference lithography (EUV-IL) utilizing transmission gratings has been a powerful patterning tool for the early development of EUV resists and related processes, playing a key role in exploring and pushing the boundaries of photon-based lithography. However, achieving patterning with HPs well below 10 nm using this method presents significant challenges. In response, this study introduces a novel EUV-IL setup that employs mirror-based technology and circumvents the limitations of diffraction efficiency towards the diffraction limit that is inherent in conventional grating-based approaches. The results are line/space patterning of the HSQ resist down to HP 5 nm using the standard EUV wavelength 13.5 nm, and the compatibility of the tool with shorter wavelengths beyond EUV. Mirror-based interference lithography paves the way towards the ultimate photon-based resolution at EUV wavelengths and beyond. This advancement is vital for scientific and industrial research, addressing the increasingly challenging needs of nanoscience and technology and future technology nodes of CMOS manufacturing in the few-nanometer HP regime. Our mirror-based lithographic technique achieves 5 nm half-pitch patterning with EUV light. This breakthrough pushes EUV lithography boundaries beyond the high-NA specifications and serves as a benchmarking platform for novel photoresists.