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Vertical Thermal Emission from Optical Antennas on an Epsilon‐Near–Zero Substrate

This work presents a novel approach to achieve directional and normal thermal emission from epsilon‐near–zero (ENZ) materials. ENZ materials exhibit near–zero permittivity at the ENZ point, resulting in some unique properties compared to conventional optical materials including infinite wavelength,...

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Bibliographic Details
Published in:Advanced optical materials 2024-09, Vol.12 (25), p.n/a
Main Authors: Khan, Irfan, Palei, Milan, Dominguez, Owen, Simmons, Evan, Podolskiy, Viktor A., Hoffman, Anthony J.
Format: Article
Language:English
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Summary:This work presents a novel approach to achieve directional and normal thermal emission from epsilon‐near–zero (ENZ) materials. ENZ materials exhibit near–zero permittivity at the ENZ point, resulting in some unique properties compared to conventional optical materials including infinite wavelength, constant phase distribution, and decoupling of spatial and temporal fields inside the ENZ material. These properties are used to engineer the far‐field thermal emission from optical antennas fabricated on ENZ film in the mid‐infrared. By coupling the antenna resonance mode with the Berreman mode of the ENZ material, highly directional and normal emission is demonstrated. This approach could have significant implications for thermal management, energy conversion, and sensing applications. This study presents a method for controlling the spectral and directional characteristics of thermal emission using optical antennas patterned on thin epsilon‐near–zero (ENZ) materials. Strong normal emission with a reduced angular spread is demonstrated. Simulations show that long‐range coupling between antennas via modes in the ENZ material and the low refractive index of the AlN thin film determines the emission characteristics.
ISSN:2195-1071
2195-1071
DOI:10.1002/adom.202400715