Towards Absolute Energy Referencing in XPS

An inherent difficulty in X‐ray photoelectron spectroscopy (XPS) regards the frequent emergence of spectral shifts due to probe‐induced surface charging. Various energy‐scale correction methods were already proposed, yet it is generally agreed that no fundamental answer to this problem has been demo...

Full description

Saved in:
Bibliographic Details
Published in:Surface and interface analysis 2025-07, Vol.57 (7), p.528-536
Main Author: Cohen, Hagai
Format: Article
Language:English
Subjects:
Charging
energy referencing
Photoelectrons
work function
X ray photoelectron spectroscopy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!