Ion extraction from the surface ablated materials in electric fields using an intense femtosecond laser pulse

In order to develop a femtosecond laser ablation (fsLA) ion source for TOF mass spectrometry, we have analyzed time-resolved images of laser-induced fluorescence from Sm + ions produced by fsLA of a solid samarium in electric fields. The polarity and the strength of electric fields had a remarkable...

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2008-09, Vol.92 (4), p.809-812
Main Authors: Kato, T., Kurata-Nishimura, M., Kobayashi, T., Okamura-Oho, Y., Sano, T., Hayashizaki, Y., Matsuo, Y., Kawai, J.
Format: Article
Language:English
Subjects:
Ablative materials
Applied physics
Characterization and Evaluation of Materials
Condensed Matter Physics
Electric field strength
Electric fields
Elongation
Femtosecond
Femtosecond pulses
Ion emission
Ion extraction
Ion sources
Laser ablation
Laser induced fluorescence
Lasers
Machines
Manufacturing
Mass spectrometry
Materials science
Nanotechnology
Optical and Electronic Materials
Physics
Physics and Astronomy
Polarity
Processes
Samarium
Surfaces and Interfaces
Thin Films
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Summary:In order to develop a femtosecond laser ablation (fsLA) ion source for TOF mass spectrometry, we have analyzed time-resolved images of laser-induced fluorescence from Sm + ions produced by fsLA of a solid samarium in electric fields. The polarity and the strength of electric fields had a remarkable effect on the expansion of Sm + ions. Moreover, accelerating electric fields elongated the duration of the ion emission from the samarium surface in fsLA, which degraded time-focusing of the ions. We have found that suppression the continuous ion emission caused by fsLA in electric fields is most important in TOF measurements.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-008-4583-2