Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy

• Published in: Ultramicroscopy 2013-02, Vol.125, p.72-80
• Main Authors: Tromp, R.M., Schramm, S.M.
• Format: Article
• Language: English
• Subjects: Aberration correction; Contrast transfer function; LEEM; TEM
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/j.ultramic.2012.09.007

The Contrast Transfer Function (CTF) describes the manner in which the electron microscope modifies the object exit wave function as a result of objective lens aberrations. For optimum resolution in C3-corrected microscopes it is well established that a small negative value of C3, offset by positive values of C5 and defocus C1 results in the most optimal instrument resolution, and optimization of the CTF has been the subject of several studies. Here we describe a simple design procedure for the CTF that results in a most even transfer of information below the resolution limit. We address not only the resolution of the instrument, but also the stability of the CTF in the presence of small disturbances in C1 and C3. We show that resolution can be traded for stability in a rational and transparent fashion. These topics are discussed quantitatively for both weak-phase and strong-phase (or amplitude) objects. The results apply equally to instruments at high electron energy (TEM) and at very low electron energy (LEEM), as the basic optical properties of the imaging lenses are essentially identical. ► An optimized Contrast Transfer Function for aberration corrected electron microscopes is proposed. ► Based on the properties of the CTF near optimum settings, we address its stability. ► Over some range of parameters resolution can be traded for stability. ► These issues are addressed for weak-phase objects, as well as strong-phase and amplitude object. ► We compare our results with CTF settings previously proposed.