Synthesis, microstructural, optical and mechanical properties of yttria stabilized zirconia thin films

• Published in: Journal of alloys and compounds 2012-09, Vol.536 (SUPPL.1), p.S412-S417
• Main Authors: Amézaga-Madrid, P., Hurtado-Macías, A., Antúnez-Flores, W., Estrada-Ortiz, F., Pizá-Ruiz, P., Miki-Yoshida, M.
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Crystallites; Exact sciences and technology; Insulators; Mechanical and acoustical properties; Mechanical properties; Microstructure; Nanostructure; Optical properties; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Physical properties of thin films, nonelectronic; Physics; Quantum confinement; Scanning electron microscopy; SEM; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Synthesis; Thin film; Thin films; Vapour deposition; Yttria stabilized zirconia
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2011.11.111

► Thin films of YSZ obtained by AACVD have high quality. ► They are uniform, very transparent, and have high hardness. ► Optical characterization were performed in detail, optical constants and band gap energy were determined as a function of dopant content. Thin films of yttria-stabilized zirconia (YSZ) exhibit exceptional properties, such as high thermal, chemical and mechanical stability. Here, we report the synthesis of YSZ thin films by aerosol assisted chemical vapour deposition onto borosilicate glass and fused silica substrates. Optimum deposition temperature was 673±5K. In addition, different Y content was tried to analyse its influence in the microstructure and properties of the films. The films were uniform, transparent and non-light scattering. Surface morphology and cross sectional microstructure were studied by field emission scanning electron microscopy. The microstructure of the films was characterized by grazing incidence X-ray diffraction. Crystallite size and lattice parameter were obtained. Optical properties were analysed from reflectance and transmittance spectra; from these measurements, optical constants and band gap were obtained. Quantum confinement effect, due to the small grain size of the films, was evident in the high band gap energy obtained. Nanoindentation tests were realized at room temperature employing the continuous stiffness measurement method, to determine the hardness and elastic modulus as a function of Y content.