Parasitic absorption in the rear reflector of a silicon solar cell: Simulation and measurement of the sub-bandgap reflectance for common dielectric/metal reflectors

• Published in: Solar energy materials and solar cells 2014-01, Vol.120, p.426-430
• Main Authors: Holman, Zachary C., Filipič, Miha, Lipovšek, Benjamin, De Wolf, Stefaan, Smole, Franc, Topič, Marko, Ballif, Christophe
• Format: Article
• Language: English
• Subjects: Applied sciences; Capacitors. Resistors. Filters; Dielectrics; Direct energy conversion and energy accumulation; Electrical engineering. Electrical power engineering; Electrical power engineering; Energy; Exact sciences and technology; Light trapping; Natural energy; Parasitic absorption; PERL; Photoelectric conversion; Photovoltaic cells; Photovoltaic conversion; Rear reflector; Reflectance; Reflectors; Silicon; Solar cell; Solar cells; Solar cells. Photoelectrochemical cells; Solar energy; Surface chemistry; Texture; Various equipment and components
• ISSN: 0927-0248; 1879-3398
• DOI: 10.1016/j.solmat.2013.06.024

The rear side of a silicon solar cell is often designed to minimize surface recombination, series resistance, and cost, but not necessarily parasitic absorption. We present a comprehensive study of parasitic absorption in the metal layer of solar cells with dielectric/metal rear reflectors. The sub-bandgap reflectance of a solar cell or test structure is proposed as an experimentally accessible probe of parasitic absorption, and it is correlated with short-circuit current density. The influence of surface texture, dielectric refractive index and thickness, and metal refractive index on sub-bandgap reflectance—and thus current—is then both calculated and measured. From the results, we formulate design rules that promote optimum infrared response in a wide variety of silicon solar cells. •Comprehensive analysis of the reflectance of dielectric/metal reflectors at the rear of silicon solar cells.•Sub-bandgap reflectance is a readily measureable metric of parasitic absorption and is correlated with short-circuit current density.•Calculation and measurement of sub-bandgap reflectance for common textures, dielectrics, and metals.•General design rules for optimizing rear reflectance: low-refractive-index dielectrics at least 100nm thick suppress absorption in even relatively poor metal reflectors.