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Technique for transfer of high-density, high-aspect-ratio nanoscale patterns in UV nanoimprint lithography and measurement of the release force
Ultraviolet nanoimprint lithography (UV-NIL) is a powerful tool for nanoscale fabrication. However, the replication of high-density, high-aspect-ratio mold patterns by UV-NIL is very difficult because of the strong forces required to release the replicate from the mold. We used a glassy carbon (GC)...
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Published in: | Microelectronic engineering 2010-05, Vol.87 (5), p.859-863 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Ultraviolet nanoimprint lithography (UV-NIL) is a powerful tool for nanoscale fabrication. However, the replication of high-density, high-aspect-ratio mold patterns by UV-NIL is very difficult because of the strong forces required to release the replicate from the mold. We used a glassy carbon (GC) mold with an antireflective structure, fabricated by irradiation with an oxygen-ion beam, to produce a high-density, high-aspect-ratio pattern, and we evaluated its release properties. The fabricated GC surface contained high-aspect-ratio conical structures with pitch of less than 100
nm. After fabrication of the antireflective structure, the mold surface was coated with chromium and a fluorinated silane coupling agent. By using this treatment and a peel motion during mold release, faithful replication of the mold structure in photocurable resin was possible. The release force increased with increasing mold surface area; the surface area effect is therefore the main factor in the mold-release step. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/j.mee.2009.12.051 |