The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis

Secondary ion mass spectrometry (SIMS), secondary electron microscopy (SEM) and X-ray analysis have been applied to the measurement of U-bearing particles with the intent of gleaning information concerning their history and/or origin. The lead isotopic abundances are definitive indicators that U-bea...

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Bibliographic Details
Published in:Journal of radioanalytical and nuclear chemistry 2010-06, Vol.284 (3), p.575-581
Main Authors: Fahey, A. J., Ritchie, N. W. M., Newbury, D. E., Small, J. A.
Format: Article
Language:English
Subjects:
Chemistry
Chemistry and Materials Science
Criminal investigation
Diagnostic Radiology
Forensic sciences
Hadrons
Heavy Ions
Inorganic Chemistry
Mass spectrometry
Nuclear Chemistry
Nuclear Physics
Origins
Physical Chemistry
Scanning electron microscopy
Secondary ion mass spectrometry
Signatures
Uranium
X-rays
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Summary:Secondary ion mass spectrometry (SIMS), secondary electron microscopy (SEM) and X-ray analysis have been applied to the measurement of U-bearing particles with the intent of gleaning information concerning their history and/or origin. The lead isotopic abundances are definitive indicators that U-bearing particles have come from an ore-body, even if they have undergone chemical processing. SEM images and X-ray analysis can add further information to the study that may allude to the extent of chemical processing. The presence of “common” lead that does not exhibit a radiogenic signature is clear evidence of anthropogenic origin.
ISSN:0236-5731
1588-2780
DOI:10.1007/s10967-010-0509-5