Modeling and Analysis of the Dead-Time Effects in Parallel PWM Two-Level Three-Phase Voltage-Source Inverters

This paper addresses modeling and analysis of the dead-time effects in parallel pulsewidth-modulated (PWM) two-level three-phase inverters. The main objective is to gain understanding of how the effects caused by the necessary blanking time, the finite turn-on and turn-off times of the switching dev...

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Bibliographic Details
Published in:IEEE transactions on power electronics 2009-11, Vol.24 (11), p.2446-2455
Main Authors: Itkonen, T., Luukko, J., Sankala, A., Laakkonen, T., Pollanen, R.
Format: Article
Language:English
Subjects:
Analysis
Blanking
Circuit simulation
Circuits
Circulating
Computer simulation
Dead-time effect
Devices
Diodes
Electric currents
Electricity
Inverters
Leg
Mathematical analysis
parallel operation
Power electronics
Pulse duration modulation
Pulse inverters
Pulse width modulation
Pulse width modulation inverters
pulsewidth modulation (PWM)
Switching
Switching circuits
Voltage
voltage-source inverter
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Summary:This paper addresses modeling and analysis of the dead-time effects in parallel pulsewidth-modulated (PWM) two-level three-phase inverters. The main objective is to gain understanding of how the effects caused by the necessary blanking time, the finite turn-on and turn-off times of the switching devices, and the forward voltage drops of the switching devices and the antiparallel diodes, i.e., the dead-time effects, influence the circulating current generation between the parallel-connected units. To meet this objective, a circulating current model taking these effects into account is developed for the parallel connection of n units. The model, which is an average model by nature, can be used to study the circulating current behavior with different types of PWM methods and to estimate the resulting circulating current values when there are differences in the dead-time effect parameters. In other words, the model provides an analytical way to consider the significance of these effects. To verify the validity of the developed model, the circuit simulation and experimental results are shown and compared with the analytical results. The illustrations show that the results obtained with the developed model are in good agreement with the circuit simulations and the experiments.
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2009.2033064