Titanium oxidation by rf inductively coupled plasma

• Published in: Journal of physics. Conference series 2014-01, Vol.511 (1), p.12077-5
• Main Authors: Valencia-Alvarado, R, de la Piedad-Beneitez, A, López-Callejas, R, Barocio, S R, Mercado-Cabrera, A, Peña-Eguiluz, R, Muñoz-Castro, A E, Rodríguez-Méndez, B G, de la Rosa-Vázquez, J M
• Format: Article
• Language: English
• Subjects: Anatase; Argon; Biomedical materials; Borosilicate glass; Implantation; Inductively coupled plasma; Oxidation; Phases; Photoelectrons; Physics; Plasma; Plasmas; Plasmas (physics); Prostheses; Raman spectroscopy; Rutile; Silicon substrates; Spectrum analysis; Sputtering; Surgical implants; Titanium; Titanium dioxide
• ISSN: 1742-6596; 1742-6588; 1742-6596
• DOI: 10.1088/1742-6596/511/1/012077

The development of titanium dioxide (TiO2) films in the rutile and anatase phases is reported. The films have been obtained from an implantation/diffusion and sputtering process of commercially pure titanium targets, carried out in up to 500 W plasmas. The experimental outcome is of particular interest, in the case of anatase, for atmospheric pollution degradation by photocatalysis and, as to the rutile phase, for the production of biomaterials required by prosthesis and implants. The reactor employed consists in a cylindrical pyrex-like glass vessel inductively coupled to a 13.56 MHz RF source. The process takes place at a 5×10−2 mbar pressure with the target samples being biased from 0 to -3000 V DC. The anatase phase films were obtained from sputtering the titanium targets over glass and silicon electrically floated substrates placed 2 cm away from the target. The rutile phase was obtained by implantation/diffusion on targets at about 700 °C. The plasma was developed from a 4:1 argon/oxygen mixture for ~5 hour processing periods. The target temperature was controlled by means of the bias voltage and the plasma source power. The obtained anatase phases did not require annealing after the plasma oxidation process. The characterization of the film samples was conducted by means of x-ray diffraction, scanning electron microscopy, x-ray photoelectron spectroscopy and Raman spectroscopy.