Full-field subwavelength imaging using a scattering superlens

Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging w...

Full description

Saved in:
Bibliographic Details
Published in:Physical review letters 2014-09, Vol.113 (11), p.113901-113901, Article 113901
Main Authors: Park, Chunghyun, Park, Jung-Hoon, Rodriguez, Christophe, Yu, HyeonSeung, Kim, Minkwan, Jin, Kyoungsuk, Han, Seungyong, Shin, Jonghwa, Ko, Seung Hwan, Nam, Ki Tae, Lee, Yong-Hee, Cho, Yong-Hoon, Park, YongKeun
Format: Article
Language:English
Subjects:
Diffraction
Imaging
Nanoparticles
Optical microscopes
Scanning probe microscopes
Scattering
Wavelengths
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging with live cells. However, this comes at the expense of a limited resolution due to the diffraction limit. Here, we demonstrate a novel method utilizing elastic scattering from disordered nanoparticles to achieve subdiffraction limited imaging. The measured far-field speckle fields can be used to reconstruct the subwavelength details of the target by time reversal, which allows full-field dynamic super-resolution imaging. The fabrication of the scattering superlens is extremely simple and the method has no restrictions on the wavelength of light that is used.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.113.113901