mu RNG: A 300-950 mV, 323 Gbps/W All-Digital Full-Entropy True Random Number Generator in 14 nm FinFET CMOS

This paper describes μRNG, an ultra-lightweight all-digital full-entropy true-random number generator (TRNG), fabricated in 14 nm high-k/metal-gate FinFET CMOS, targeted for on-die generation of cryptographic keys in energy-constrained IoT and wearable platforms. The μRNG combines the entropy of mul...

Full description

Saved in:
Bibliographic Details
Published in:IEEE journal of solid-state circuits 2016-07, Vol.51 (7), p.1695-1704
Main Authors: Mathew, Sanu K., Johnston, David, Satpathy, Sudhir, Suresh, Vikram, Newman, Paul, Anders, Mark A., Kaul, Himanshu, Agarwal, Amit, Hsu, Steven K., Chen, Gregory, Krishnamurthy, Ram K.
Format: Article
Language:English
Subjects:
All-digital entropy generation
CMOS
CMOS integrated circuits
Confidence intervals
cryptographic-quality key-generation
Decorrelation
Electric potential
Energy consumption
Entropy
FinFETs
full-entropy true random number generator
Generators
Inverters
IOT/wearable security
metastability
Power consumption
Throughput
ultra-lightweight entropy extractor
Voltage
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!