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Position algorithm for monolithic scintillation crystals based on charge projection readout

Nuclear medicine imaging devices commonly use multi-element photo detection systems, composed of an array of N x N elements, each one providing an individual signal. Many strategies have been developed to reduce the number of readout channels, one of the main approaches is the Rows and Columns (R/C)...

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Bibliographic Details
Published in:Journal of instrumentation 2016-01, Vol.11 (1), p.C01061-C01061
Main Authors: Pani, R., Bettiol, M., Preziosi, E., Cinti, M.N., Borrazzo, C., Pellegrini, R., Castro, E. Di, Fabbri, A.
Format: Article
Language:English
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Summary:Nuclear medicine imaging devices commonly use multi-element photo detection systems, composed of an array of N x N elements, each one providing an individual signal. Many strategies have been developed to reduce the number of readout channels, one of the main approaches is the Rows and Columns (R/C) projection logic. In this paper we proposed a modified version of Raised To the Power(RTP) algorithm adapted to R/C logic. In order to validate its efficiency a linear scanning irradiation on two 49x 49 mm super(2) LaBr sub(3):Ce (0.5%) crystals with different thickness (4 mm and 10 mm) was carried out. Imaging performance analysis was made in terms of position linearity, Field-of-View (FoV) enlargement and spatial resolution. Imaging results from Anger Logic, RTP algorithm based on single element readout and RTP algorithm based on R/C readout were compared. A notable advantage of using RTP algorithms instead of Anger Logic was found: the FoV widens from about 30% to more than 70% of the detector area whereas the spatial resolution is highly improved, especially for off-center interactions, both for 4 mm-thick and 10 mm-thick crystals. Furthermore, imaging performance with the R/C readout is just slightly different from the single element one (FoV reduction less than 7% and SR worsening less than 10%). The R/C adapted RTP algorithm opens doors to high imaging performance with a substantial reduction of complexity and cost in the readout electronics.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/11/01/C01061