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Can Electron-Rich Oxygen (O2–) Withdraw Electrons from Metal Centers? A DFT Study on Oxoanion-Caged Polyoxometalates
The answer to the question “Can electron-rich oxygen (O 2– ) withdraw electrons from metal centers?” is seemingly simple, but how the electron population on the M atom behaves when the O–M distance changes is a matter of controversy. A case study has been conducted for Keggin-type polyoxometalate (P...
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Published in: | The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory Molecules, spectroscopy, kinetics, environment, & general theory, 2017-10, Vol.121 (40), p.7684-7689 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The answer to the question “Can electron-rich oxygen (O 2– ) withdraw electrons from metal centers?” is seemingly simple, but how the electron population on the M atom behaves when the O–M distance changes is a matter of controversy. A case study has been conducted for Keggin-type polyoxometalate (POM) complexes, and the first-principles electronic structure calculations were carried out not only for real POM species but also for “hypothetical” ones whose heteroatom was replaced with a point charge. From the results of natural population analysis, it was proven that even an electron-rich O2–, owing to its larger electronegativity as a neutral atom, withdraws electrons when electron redistribution occurs by the change of the bond length. In the case where O2– coexists with a cation having a large positive charge (e.g., P5+(O2–)4 = [PO4]3–), the gross electron population (GEP) on the M atom seemingly increases as the O atom comes closer, but this increment in GEP is not due to the role of the O atom but due to a Coulombic effect of the positive charge located on the cation. Furthermore, it was suggested that not GEP but net electron population (NEP) should be responsible for the redox properties. |
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ISSN: | 1089-5639 1520-5215 |
DOI: | 10.1021/acs.jpca.7b05950 |