One dimensional magnetic resonance microscopy with micrometer resolution in static field gradients

• Published in: Journal of magnetic resonance (1997) 2019-10, Vol.307, p.106566-106566, Article 106566
• Main Authors: Kresse, B., Höfler, M.V., Privalov, A.F., Vogel, M.
• Format: Article
• Language: English
• Subjects: Magnetic resonance imaging (MRI); Magnetic resonance microscopy (MRM); Micrometer resolution; Probe head design; Static field gradient; Stray field imaging (STRAFI)
• ISSN: 1090-7807; 1096-0856
• DOI: 10.1016/j.jmr.2019.106566

[Display omitted] •Magnetic resonance microscopy with 2 micrometer resolution in one dimension.•Probe head for precise sample alignment with respect to static field gradient.•Compensation of experimental imperfections by stepwise sample movement. Magnetic resonance microscopy (MRM) is a valuable tool for spatially resolved studies. While it is desirable to address voxels in the general case, it is sufficient to resolve slices of the sample in many cases of practical importance, e.g., for layered structures or at planar surfaces. We demonstrate that use of high static field gradients of 73 T/m in combination with a specially designed probe head enable MRM with an ultrahigh resolution of ∼2 μm in one dimension. The key feature of the built probe head is a precise computer controlled adjustment of the sample position and orientation, which allows for an accurate alignment of the samples with respect to the gradient of the magnetic field. Since slice-wise scanning of extended samples with this high spatial resolution is time-consuming, we introduce a methodology to reduce the experimental time significantly. Unlike the usual approach, which involves elaborate hardware and software correction, experimental imperfections are removed by stepwise moving the sample in our case. We demonstrate the capabilities of high-resolution 1D MRM for a solid sample with a layered structure and a liquid droplet on a planar solid substrate.