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Low-temperature vacuum tunneling microscopy

We report what we believe is the first use of a vacuum tunneling microscope to spatially resolve changes in the electronic structure of a superconducting surface. The exponential dependence of the tunneling resistance on gap spacing is demonstrated at 300, 77, and 15 K. Current-voltage characteristi...

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Bibliographic Details
Published in:Applied physics letters 1984-01, Vol.45 (11), p.1240-1242
Main Authors: ELROD, S. A, DE LOZANNE, A. L, QUATE, C. F
Format: Article
Language:English
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Summary:We report what we believe is the first use of a vacuum tunneling microscope to spatially resolve changes in the electronic structure of a superconducting surface. The exponential dependence of the tunneling resistance on gap spacing is demonstrated at 300, 77, and 15 K. Current-voltage characteristics at low temperature show a structure that can be attributed to the superconducting gap of the Nb3Sn sample studied. We observe reproducible changes in this structure as the tip is laterally scanned between two locations on the surface separated by 220 Å.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.95077