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Auger analysis of platinum field emitters
Surface segregation on platinum emitters was studied by means of field emission microscopy and very high resolution Auger electron spectroscopy. Surfaces with the characteristic {100} ring structure (mainly Sigmund Cohn wire), which is stable to about 1500 K, were found to be phosphorus contaminated...
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Published in: | Surface science 1985-06, Vol.155 (1), p.121-131 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Surface segregation on platinum emitters was studied by means of field emission microscopy and very high resolution Auger electron spectroscopy. Surfaces with the characteristic {100} ring structure (mainly Sigmund Cohn wire), which is stable to about 1500 K, were found to be phosphorus contaminated. When such emitters were heated between 870 and 1250 K, silicon as well as small amounts of S and C segregated to the {100} area and caused the ring the broaden. The latter shrank in size upon heating to above 1250 K, indicating a dissolution of Si in the Pt bulk. On other platinum surfaces (Materials Research wire), which showed after heat treatment a predominant Si contamination, {100} ring structures did not appear, instead, {012} planes developed in a temperature range of 870–1030 K. Vapor deposition of P on surfaces with very low P contamination and of Si on surfaces with very low Si contamination resulted in the appearance of {100} ring structures and {012} planes, respectively. |
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ISSN: | 0039-6028 1879-2758 |
DOI: | 10.1016/0039-6028(85)90408-X |