Atomic force microscopy and scanning electron microscopy study of MgO(110) surface faceting

• Published in: Surface science 2000-06, Vol.457 (3), p.326-336
• Main Authors: Giese, D.R, Lamelas, F.J, Owen, H.A, Plass, R, Gajdardziska-Josifovska, M
• Format: Article
• Language: English
• Subjects: Atomic force microscopy; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Etching; Exact sciences and technology; Faceting; Low index single crystal surfaces; Magnesium oxides; Materials science; Physics; Scanning electron microscopy (SEM); Solid surfaces and solid-solid interfaces; Surface cleaning, etching, patterning; Surface structure and topography; Surface structure, morphology, roughness, and topography; Surface thermodynamics (including phase transitions); Surface treatments; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Vicinal single crystal surfaces
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/S0039-6028(00)00382-4

Phosphoric- and nitric-acid etching of the MgO(110) surface generates vicinal faceting in both the 〈001〉 and 〈110〉 directions. Vacuum annealing (to 1000°C) does not introduce thermal faceting, and does not alter the chemical-etch morphology. Three types of acid-induced faceting (early-stage pits, later-stage grooves, and inverted trapezoidal pyramids) are seen as a function of etching time. Facet-angle analysis by atomic force microscopy (AFM) and scanning electron microscopy (SEM) shows the etch morphology to be vicinal, with angles in the range of 9° to 23°, not the low-energy {100} planes expected from minimization of surface energy.