NDE of defects in Superconducting wires using SQUID microscopy

Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2005-06, Vol.15 (2), p.707-710
Main Authors: Su-Young Lee, Viswanathan, V., Huckans, J., Matthews, J., Wellstood, F.C.
Format: Article
Language:English
Subjects:
Applied sciences
Copper
Defects
Electrical engineering. Electrical power engineering
Electronics
Exact sciences and technology
Interference
Magnetic field measurement
Magnetic resonance imaging
Materials
Microscopes
Microscopy
MRI
NDE
Nondestructive testing
SQUID
SQUIDs
Superconducting coils
Superconducting filaments and wires
Superconducting magnets
Superconducting quantum interference devices
superconducting wire
Superconductivity
Testing, measurement, noise and reliability
Tubes
Wire
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also have examined known defects using a multi-channel scanning SQUID microscope. In addition, we have modified the nose cone of our SQUID microscope to enable fast NDE of long wires by positioning a thin tube immediately beneath the SQUID chip, while feeding the wire through the tube.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2005.850020