Loading…
Growth of epitaxial CrN on MgO(001): Role of deposition angle on surface morphological evolution
CrN layers, 6 to 500 nm thick, were grown on MgO(001) at 600 °C by ultra-high-vacuum magnetron sputter deposition in pure N 2 discharges at 2.6 Pa. The deposition angle α with respect to the surface normal was varied from 0° to 80° in order to directly probe the effect of atomic shadowing on the sur...
Saved in:
Published in: | Thin solid films 2006-01, Vol.494 (1), p.330-335 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | CrN layers, 6 to 500 nm thick, were grown on MgO(001) at 600 °C by ultra-high-vacuum magnetron sputter deposition in pure N
2 discharges at 2.6 Pa. The deposition angle
α with respect to the surface normal was varied from 0° to 80° in order to directly probe the effect of atomic shadowing on the surface morphological evolution. Layers grown with
α
=
0° are single crystals which develop a regular surface mound structure. At low layer thicknesses,
t
≲
25 nm, the surface mounds grow primarily vertically, due to kinetic roughening, and form square-shapes with edges along low-energy 〈100〉, directions. Continued growth at
t
≳
25 nm is dominated by mound-competition and coalescence which leads to a self-similar growth mode with increases in both mound height and width. Layers deposited from oblique angles
α
=
80° also nucleate as single crystals with a cube-on-cube epitaxial relationship with the substrate. However, rough surfaces with cauliflower-type morphologies cause the nucleation of misoriented CrN grains that develop into cone-shaped grains that protrude out of the epitaxial matrix to form triangular faceted surface mounds. Atomic shadowing exacerbates the growth rate of these misoriented grains, causing a dramatic increase in the root-mean-square surface roughness, which is ∼
16× higher for layers grown at
α
=
80° than at
α
=
0°. The roughening follows a power-law with a roughening exponent
β that increases from 0.37
±
0.04 to 0.57
±
0.15 as
α is increased from 0° to 80°. This increase is attributed to a transition from kinetic roughening to roughening caused by atomic shadowing effects. |
---|---|
ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2005.08.244 |