CONCURRENT BIST SYNTHESIS AND TEST SCHEDULING USING GENETIC ALGORITHMS

This paper presents an efficient method for concurrent built-in self-test synthesis and test scheduling in high-level synthesis. The method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and interconnects. The method is based on a genetic...

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Bibliographic Details
Published in:International journal of computers & applications 2007, Vol.29 (2), p.132-142
Main Authors: Harmanani, H.M., jar, A.M.K. Ha
Format: Article
Language:English
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Summary:This paper presents an efficient method for concurrent built-in self-test synthesis and test scheduling in high-level synthesis. The method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and interconnects. The method is based on a genetic algorithm that efficiently explores the testable design space and finds a sub-optimal test registers assignment for each k-test session. The method was implemented using C++ on a Linux workstation. Several benchmark examples have been implemented and favorable design comparisons are reported.
ISSN:1925-7074
1206-212X
DOI:10.2316/Journal.202.2007.2.202-1774