On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films

X-ray photoelectron spectroscopy (XPS) spectra of sputter-etched nc-TiC/a-C nanocomposite thin films published in literature show an extra feature of unknown origin in the C1s region. This feature is situated between the contributions of carbide and the carbon matrix. We have used high kinetic energ...

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Bibliographic Details
Published in:	Surface & coatings technology 2008-04, Vol.202 (15), p.3563-3570
Main Authors:	Lewin, E., Persson, P.O.Å., Lattemann, M., Stüber, M., Gorgoi, M., Sandell, A., Ziebert, C., Schäfers, F., Braun, W., Halbritter, J., Ulrich, S., Eberhardt, W., Hultman, L., Siegbahn, H., Svensson, S., Jansson, U.
Format:	Article
Language:	English
Subjects:	Applied sciences Chemistry Cross-disciplinary physics: materials science rheology Exact sciences and technology Inorganic chemistry Kemi Materials science Metals. Metallurgy Methods of deposition of films and coatings film growth and epitaxy Nanocomposite coatings NATURAL SCIENCES NATURVETENSKAP Oorganisk kemi Physics Production techniques Sputtering Surface treatment Surface treatments Transmission electron microscopy (TEM) X-ray photoelectron spectroscopy (XPS)
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