Determination of crystal phase from an electron backscatter diffraction pattern

• Published in: Journal of applied crystallography 2009-04, Vol.42 (2), p.234-241
• Main Authors: Dingley, David J., Wright, Stuart I.
• Format: Article
• Language: English
• Subjects: Crystallography; Diffraction; electron backscatter diffraction; Electron microscopes; Electrons; Research methodology; unit-cell determination
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S0021889809001654

Electron backscatter diffraction (EBSD) is a scanning electron microscope‐based technique principally used for the determination and mapping of crystal orientation. This work describes an adaptation of the EBSD technique into a potential tool for crystal phase determination. The process can be distilled into three steps: (1) extracting a triclinic cell from a single EBSD pattern, (2) identifying the crystal symmetry from an examination of the triclinic cell, and (3) determining the lattice parameters. The triclinic cell is determined by finding the bands passing through two zone axes in the pattern including a band connecting the two. A three‐dimensional triclinic unit cell is constructed based on the identified bands. The EBSD pattern is indexed in terms of the triclinic cell thus formed and the crystal orientation calculated. The pattern indexing results in independent multiple orientations due to the symmetry the crystal actually possesses. By examining the relationships between these multiple orientations, the crystal system is established. By comparing simulated Kikuchi bands with the pattern the lattice parameters can be determined. Details of the method are given for a test case of EBSD patterns obtained from the hexagonal phase of titanium.