Characterization of environmental nanoparticles

• Published in: Applied surface science 2008-12, Vol.255 (4), p.1538-1540
• Main Authors: Fukuhara, N., Suzuki, K., Takeda, K., Nihei, Y.
• Format: Article
• Language: English
• Subjects: Atmospheric environment; Diesel exhaust particle; FE-SEM; Nanoparticle; SMPS; TOF-SIMS
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2008.05.013

In this study, we attempted to characterize environmental nanoparticles and particle diameter distributions in the atmospheric environment neighboring a traffic route by using a scanning mobility particle sizer (SMPS). The composition of the environmental nanoparticles was analyzed using time-of-flight secondary ion mass spectrometry (TOF-SIMS). It was observed that the environmental nanoparticles showed peaks at 20 nm and 100 nm. The secondary ions C +, O +, Si +, and SiH 3 + were strongly detected in the environmental nanoparticles with a peak at 20 nm. On the other hand, the secondary ions NH 4 +, Na +, K +, and Ca + were detected in the environmental nanoparticles with a peak at 100 nm. Moreover, it was found that the secondary ion spectral patterns of the organic compounds were different for each particle diameter. Hence, we concluded that the combination of the SMPS with TOF-SIMS is a powerful technique to characterize environmental nanoparticles.