Loading…
Topographic voltage and coherence mapping of brain potentials by means of the symbolic resonance analysis
We apply the recently developed symbolic resonance analysis to electroencephalographic measurements of event-related brain potentials (ERPs) in a language processing experiment by using a three-symbol static encoding with varying thresholds for analyzing the ERP epochs, followed by a spin-flip trans...
Saved in:
Published in: | Physical review. E, Statistical, nonlinear, and soft matter physics Statistical, nonlinear, and soft matter physics, 2005-11, Vol.72 (5 Pt 1), p.051916-051916, Article 051916 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | We apply the recently developed symbolic resonance analysis to electroencephalographic measurements of event-related brain potentials (ERPs) in a language processing experiment by using a three-symbol static encoding with varying thresholds for analyzing the ERP epochs, followed by a spin-flip transformation as a nonlinear filter. We compute an estimator of the signal-to-noise ratio (SNR) for the symbolic dynamics measuring the coherence of threshold-crossing events. Hence, we utilize the inherent noise of the EEG for sweeping the underlying ERP components beyond the encoding thresholds. Plotting the SNR computed within the time window of a particular ERP component (the N400) against the encoding thresholds, we find different resonance curves for the experimental conditions. The maximal differences of the SNR lead to the estimation of optimal encoding thresholds. We show that topographic brain maps of the optimal threshold voltages and of their associated coherence differences are able to dissociate the underlying physiological processes, while corresponding maps gained from the customary voltage averaging technique are unable to do so. |
---|---|
ISSN: | 1539-3755 1550-2376 |
DOI: | 10.1103/PhysRevE.72.051916 |