Mathematical formulations for the schlieren detection method applied to the measurement of photodeformation

In a schlieren detection scheme for photodeformation measurements, the divergence of the probe beam that is induced by the axisymmetric but radially inhomogeneous periodic photothermal displacement of the surface of a sample is transformed into an intensity variation by insertion of an iris in front...

Full description

Saved in:
Bibliographic Details
Published in:Applied optics (2004) 2002-02, Vol.41 (6), p.1128-1144
Main Authors: Cournoyer, Alain, Baulaigue, Pierre, Bures, Jacques, Bertrand, Lionel, Occelli, Roland
Format: Article
Language:English
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In a schlieren detection scheme for photodeformation measurements, the divergence of the probe beam that is induced by the axisymmetric but radially inhomogeneous periodic photothermal displacement of the surface of a sample is transformed into an intensity variation by insertion of an iris in front of the detection photodiode. We present three expressions for the intensity profile of a Gaussian laser beam that is reflected by the inhomogeneous photodeformation of a solid. The first expression proceeds from geometrical optics (or photometry), whereas the second one derives from the use of the well-known ABCD law and the third one from diffraction principles. Comparing these formulations of the schlieren signal with their behavior as a function of different geometrical parameters, we obtain the domain of validity of each expression, and we deduce the advantages of the different formalisms.
ISSN:1559-128X
DOI:10.1364/AO.41.001128