Isotopic metrology of carbon dioxide. I. Interlaboratory comparison and empirical modeling of inlet equilibration time, inlet pressure, and ion source conductance

• Published in: Rapid communications in mass spectrometry 2003-01, Vol.17 (8), p.771-776
• Main Authors: Verkouteren, R. Michael, Allison, Colin E., Studley, Steven A., Leckrone, Kristen J.
• Format: Article
• Language: English
• ISSN: 0951-4198; 1097-0231
• DOI: 10.1002/rcm.905

We report a pilot study of high‐precision differential isotope ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sample size, ion source conductance, and inlet changeover equilibration time on the raw measurements. Our goal was better understanding of factors that influence these measurements in order to establish procedures for highly reproducible and accurate determinations of Reference Material (RM) isotopic compositions. Evaluation and modeling of reported data illuminated effects consistent with two instrumental memory sources—one short‐lived (t½ ∼ 10 s) and the other long‐lived (t½ ∼ 6–10 min), uncompensated by normal background measurements—that can significantly influence measurements made by the dual inlet method. These biases, proportional to the difference in isotopic compositions between the measured sample and reference gases, decrease in magnitude with increasing sample size, source conductance, and equilibration time. We observed biases as high as 0.1‰ per 10‰ difference between sample and reference gases. These memory sources may be responsible for measured δ13C values of RMs generally being highly reproducible within any single laboratory but less reproducible among independent laboratories. The magnitude of the bias is consistent with the ranges of δ13C values reported in prior laboratory intercomparisons. Uncertainties are most likely due to high and variable long‐lived memory among the instruments tested. Published in 2003 by John Wiley & Sons, Ltd.