First demonstration of iodine mapping in nonliving phantoms using an X-ray fluorescence computed tomography system with a cadmium telluride detector and a tungsten-target tube

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2011-05, Vol.638 (1), p.187-191
• Main Authors: Sato, Eiichi, Sato, Yuichi, Ehara, Shigeru, Abudurexiti, Abulajiang, Hagiwara, Osahiko, Matsukiyo, Hiroshi, Osawa, Akihiro, Enomoto, Toshiyuki, Watanabe, Manabu, Nagao, Jiro, Sato, Shigehiro, Ogawa, Akira, Onagawa, Jun
• Format: Article
• Language: English
• Subjects: CdTe detector; Energy dispersion; Iodine atoms; Tungsten-target tube; X-ray computed tomography; X-ray fluorescence analysis
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2011.02.073

X-ray fluorescence (XRF) analysis is useful for mapping various atoms in objects, and XRF is emitted by absorbing X-ray photons with energies beyond the K-edge energy of the target atom. Narrow-energy-width bremsstrahlung X-rays are selected using a 3.0-mm-thick aluminum filter. These rays are absorbed by iodine media in objects, and iodine XRF is produced from the iodine atoms. Next, iodine Kα photons are discriminated by a multichannel analyzer and the number of photons is counted by a counter card. CT is performed by repeated linear scans and rotations of an object. The X-ray generator has a 100 μm focus tube with a 0.5-mm-thick beryllium window, and the tube voltage and the current for XRF were 80 kV and 0.50 mA, respectively. The demonstration of XRF-CT for mapping iodine atoms was carried out by selection of photons in an energy range from 27.5 to 29.5 keV with a photon-energy resolution of 1.2 keV.