Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

• Published in: IEEE transactions on nuclear science 2006-08, Vol.53 (4), p.2047-2053
• Main Authors: Boulghassoul, Y., Massengill, L.W., Sternberg, A.L., Bhuva, B.L., Holman, W.T.
• Format: Article
• Language: English
• Subjects: Character generation; Charge pump; Charge pumps; Circuit design; Circuits; Computer simulation; Design engineering; Digital; digital phase-locked loop (DPLL); frequency-phase detector; hardening by design; High speed; Ionizing radiation; Modules; Phase frequency detector; Phase locked loops; Radiation hardening; Radio frequencies; Radio frequency; RF operation; single-event transients (SETs); Transient analysis; voltage-controlled oscillator (VCO)
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2006.876035

In this work, the characteristics of single-event transient (SET) generation and propagation are analyzed in a digital phase-locked loop (DPLL) circuit, designed to achieve speeds applicable to mixed-signal RF operations. The analysis shows that the sensitivity of a DPLL system is strongly dependent on which of its modules is subjected to ionizing radiation. Computer simulations of single-event transients on the phase-frequency detector module and the voltage-controlled oscillator module indicate that their radiation responses have a negligible impact on the DPLL normal operations. More importantly, our findings identify the sensitivity of the charge pump module as the dominant contributor to the radiation vulnerability of the DPLL system. The charge pump incorporates a design element that is favorable to achieving high-speed operations, but simultaneously introduces a circuit configuration that can be easily perturbed by the impact of a heavy-ion. Hardening by design techniques that could be used to mitigate this issue are also discussed