Force Volume Atomic Force Microscopy–Infrared for Simultaneous Nanoscale Chemical and Mechanical Spectromicroscopy

Photothermal atomic force microscopy–infrared (AFM-IR) combines the nanoscale spatial resolution of AFM with the chemical identification capability of infrared spectroscopy and has thrived in various applications. Currently executed in three major AFM modes (contact, tapping, and peak force tapping)...

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Bibliographic Details
Published in:ACS nano 2025-05, Vol.19 (19), p.18791-18803
Main Authors: Wagner, Martin, Hu, Qichi, Hu, Shuiqing, Phillips, Cassandra, Wang, Weijie, Pittenger, Bede, Fali, Alireza, Li, Chunzeng, Mathurin, Jérémie, Dazzi, Alexandre, Su, Chanmin, De Wolf, Peter
Format: Article
Language:English
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