Layer matching epitaxy of NiO thin films on atomically stepped sapphire (0001) substrates

Thin-film epitaxy is critical for investigating the original properties of materials. To obtain epitaxial films, careful consideration of the external conditions, i.e. single-crystal substrate, temperature, deposition pressure and fabrication method, is significantly important. In particular, select...

Full description

Saved in:
Bibliographic Details
Published in:Scientific reports 2015-09, Vol.5 (1), p.14385-14385, Article 14385
Main Authors: Yamauchi, Ryosuke, Hamasaki, Yosuke, Shibuya, Takuto, Saito, Akira, Tsuchimine, Nobuo, Koyama, Koji, Matsuda, Akifumi, Yoshimoto, Mamoru
Format: Article
Language:English
Subjects:
639/301/357/537
639/925/357
Electron microscopy
Epitaxy
Fabrication
Humanities and Social Sciences
Industrial applications
multidisciplinary
Science
Substrates
Temperature effects
Thin films
Transmission electron microscopy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Thin-film epitaxy is critical for investigating the original properties of materials. To obtain epitaxial films, careful consideration of the external conditions, i.e. single-crystal substrate, temperature, deposition pressure and fabrication method, is significantly important. In particular, selection of the single-crystal substrate is the first step towards fabrication of a high-quality film. Sapphire (single-crystalline α-Al 2 O 3 ) is commonly used in industry as a thin-film crystal-growth substrate and functional thin-film materials deposited on sapphire substrates have found industrial applications. However, while sapphire is a single crystal, two types of atomic planes exist in accordance with step height. Here we discuss the need to consider the lattice mismatch for each of the sapphire atomic layers. Furthermore, through cross-sectional transmission electron microscopy analysis, we demonstrate the uniepitaxial growth of cubic crystalline thin films on bistepped sapphire (0001) substrates.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep14385