Loading…

Breakdown of Hooke's law of elasticity at the Mott critical endpoint in an organic conductor

The Mott metal-insulator transition, a paradigm of strong electron-electron correlations, has been considered as a source of intriguing phenomena. Despite its importance for a wide range of materials, fundamental aspects of the transition, such as its universal properties, are still under debate. We...

Full description

Saved in:
Bibliographic Details
Published in:Science advances 2016-12, Vol.2 (12), p.e1601646-e1601646
Main Authors: Gati, Elena, Garst, Markus, Manna, Rudra S, Tutsch, Ulrich, Wolf, Bernd, Bartosch, Lorenz, Schubert, Harald, Sasaki, Takahiko, Schlueter, John A, Lang, Michael
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The Mott metal-insulator transition, a paradigm of strong electron-electron correlations, has been considered as a source of intriguing phenomena. Despite its importance for a wide range of materials, fundamental aspects of the transition, such as its universal properties, are still under debate. We report detailed measurements of relative length changes Δ / as a function of continuously controlled helium-gas pressure for the organic conductor κ-(BEDT-TTF) Cu[N(CN) ]Cl across the pressure-induced Mott transition. We observe strongly nonlinear variations of Δ / with pressure around the Mott critical endpoint, highlighting a breakdown of Hooke's law of elasticity. We assign these nonlinear strain-stress relations to an intimate, nonperturbative coupling of the critical electronic system to the lattice degrees of freedom. Our results are fully consistent with mean-field criticality, predicted for electrons in a compressible lattice with finite shear moduli. We argue that the Mott transition for all systems that are amenable to pressure tuning shows the universal properties of an isostructural solid-solid transition.
ISSN:2375-2548
2375-2548
DOI:10.1126/sciadv.1601646