Experimental reconstruction of the contact resonance shape factor for quantification and amplification of bias-induced strain in atomic force microscopy

The contact resonance (CR) of a surface coupled atomic force microscope (AFM) cantilever can act as an amplifier of AC surface motion for piezoresponse force microscopy and related methods. However, the amplifier properties of the CR vary depending on tip-sample boundary conditions, leading to the a...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2019-04, Vol.114 (13)
Main Authors: Killgore, Jason P., Deolia, Akshay, Robins, Lawrence, Murray, Todd W.
Format: Article
Language:English
Subjects:
Amplifiers
Applied physics
Atomic force microscopes
Atomic force microscopy
Boundary conditions
Displacement
Frequency analysis
Lithium niobates
Mathematical models
Microscopes
Microscopy
Parameter uncertainty
Reconstruction
Shape factor
Stiffness
Surface motion
Uncertainty analysis
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The contact resonance (CR) of a surface coupled atomic force microscope (AFM) cantilever can act as an amplifier of AC surface motion for piezoresponse force microscopy and related methods. However, the amplifier properties of the CR vary depending on tip-sample boundary conditions, leading to the appearance of displacement amplitude contrast when only stiffness contrast exists. It was recently proposed that the shape of the vibrating cantilever as a function of CR frequency could be analytically modeled and a shape factor calibration could be applied. Here, we demonstrate an experimental reconstruction of the contact resonance shape factor that can be used to quantify surface displacements in AFM measurements, without reliance on analytical models with uncertain input parameters. We demonstrate accurate quantification of surface displacement in periodically poled lithium niobate and pave the way for quantification of extremely small surface strains in the future.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.5091803