X-ray photoelectron spectroscopy study of chromium and magnesium doped copper ferrite thin film

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements. Moreover, XPS is also widely used in semiconductor applications as the main characteriza...

Full description

Saved in:
Bibliographic Details
Main Authors: Soe, Thiha, Jityen, Arthit, Kongkaew, Teerakorn, Subannajui, Kittitat, Sinsarp, Asawin, Osotchan, Tanakorn
Format: Conference Proceeding
Language:English
Subjects:
Annealing
Chemical composition
Chromium
Copper
Copper ferrite
Electron states
Ferric ions
Glass substrates
High temperature
Ions
Iron
Low temperature
Magnesium
Oxidation
Photoelectrons
Room temperature
Spectrum analysis
Spin coating
Stoichiometry
Surface properties
Temperature
Thin films
Valence
X ray photoelectron spectroscopy
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!