Correlation between X-ray diffraction line profile and microstructure of spheroidized Alumina micropowder for 3D printing application

• Main Authors: Sreenivasan, M., Babu, G. Ebinezaru, Krishna, Ram, Lyutyk, M., Barosh, M.
• Format: Conference Proceeding
• Language: English
• Subjects: 3-D printers; Alumina; Aluminum oxide; Cracks; Deformation; Mathematical models; Microstructure; Parameters; Radio frequency; Radio frequency plasma; Scanning electron microscopy; Spheroidizing; Spheroids; Three dimensional printing; X ray powder diffraction; X-ray diffraction
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/5.0134169

Alumina micropowder with the required properties was manufactured with a radio frequency plasma spheroidization process for applications in ceramics 3D printing. By using this advanced approach of radio frequency plasma spheroidization, it was relatively easier to synthesize micropowders from lumps of the material in a controlled environment. In this study, scanning electron microscopy (SEM) and powder X-ray diffraction (XRD) were employed to determine the microstructural parameters of plasma processed alumina micropowders. A relationship between the X-ray diffraction line profile and the microstructure of spheroidized alumina is identified. Under the plasma spheroidization process, the structural and microstructural properties of alumina evolve. As a result, spheroids of alumina exhibit changes in the microstructural parameters and structural change. Microstructural parameters were obtained through XRD line profile analysis of spheroidized alumina and compared with morphological parameters obtained through SEM analysis. Using the microstructure response model, we demonstrate that the microstructural response of alumina can be predicted, and the microstructural parameters can be evaluated using uniform deformation and uniform stress deformation models. The observation of intergranular cracks and sub-cracks on the surface of the alumina spheroids is a new finding reported in the paper.