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Atomic layer deposition of nickel oxide films using Ni ( dmamp ) 2 and water
A precursor originally synthesized for the chemical vapor deposition of metallic nickel, Ni ( dmamp ) 2 ( dmamp = 1-dimethylamino-2-methyl-2-propanolate, - OC Me 2 C H 2 N Me 2 ), has been adopted as a nickel source for the atomic layer deposition of nickel oxide (NiO) using water ( H 2 O ) as the o...
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Published in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2005-07, Vol.23 (4), p.1238-1243 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A precursor originally synthesized for the chemical vapor deposition of metallic nickel,
Ni
(
dmamp
)
2
(
dmamp
=
1-dimethylamino-2-methyl-2-propanolate, -
OC
Me
2
C
H
2
N
Me
2
), has been adopted as a nickel source for the atomic layer deposition of nickel oxide (NiO) using water
(
H
2
O
)
as the oxygen source. The precursor is a solid at room temperature, but readily sublimes at 90 °C. The self-limiting atomic layer deposition (ALD) process by alternate surface reactions of
Ni
(
dmamp
)
2
and
H
2
O
was confirmed from thickness measurements of the NiO films grown with varying
Ni
(
dmamp
)
2
supply times and numbers of the
Ni
(
dmamp
)
2
-
H
2
O
ALD cycles. The ALD temperature window for this precursor was found to be between 90 and 150 °C. Under optimal reaction conditions, the growth rate of the NiO films was
∼
0.8
Å
∕
cycle
. The NiO films deposited on Si(001) at 120 °C were characterized by x-ray diffraction, x-ray photoelectron spectroscopy, scanning electron microscopy, and atomic force microscopy. The x-ray diffraction patterns showed no distinct peaks for NiO, indicating that the films deposited at this temperature were amorphous. X-ray photoelectron spectroscopy analysis showed the films to be stoichiometric with no detectable amount of carbon impurities. For a film with the thickness of 810 Å (with 1000 ALD cycles) the root-mean-square surface roughness was only
∼
4
Å
as measured by atomic force microscopy. To elucidate the ALD mechanism of the Ni precursor with water, a quadrupole mass analyzer was employed with
D
2
O
as the oxygen source in lieu of
H
2
O
. Interestingly, unlike the usual ALD fashion, the
Ni
(
dmamp
)
2
precursor does not seem to decompose but only coordinatively bond to the OH-terminated surface when it was introduced. Next, the
Ni
(
dmamp
)
2
-surface species decompose to produce a hydroxylated nickel oxide surface and the alcohol dmampH when water was supplied. |
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ISSN: | 0734-2101 1520-8559 |
DOI: | 10.1116/1.1875172 |