Speckle-based x-ray phase-contrast and dark-field imaging with a laboratory source

We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-...

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Bibliographic Details
Published in:Physical review letters 2014-06, Vol.112 (25), p.253903-253903, Article 253903
Main Authors: Zanette, I, Zhou, T, Burvall, A, Lundström, U, Larsson, D H, Zdora, M, Thibault, P, Pfeiffer, F, Hertz, H M
Format: Article
Language:English
Subjects:
Algorithms
Coherence
Imaging
Information
Retrieval
Scattering
Speckle patterns
Tomography
Tracking
X-ray sources
X-rays
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Summary:We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-ray imaging. Here, we use the speckle pattern for multimodal imaging of demonstrator objects. Moreover, we introduce algorithms for phase and dark-field imaging using speckle tracking, and we show that they yield superior results with respect to existing methods.
ISSN:0031-9007
1079-7114
1079-7114
DOI:10.1103/PhysRevLett.112.253903