Logic testing and design for testability / Hideo Fujiwara.

Saved in:
Bibliographic Details
Main Author: Fujiwara, Hideo
Format: Book
Language:English
Published: Cambridge, Mass. ; London : MIT Press, c1985.
Series:MIT Press series in computer systems
Subjects:
Logic circuits > Testing.
Electronic digital computers > Testing.
Logic design.
Tags: Add Tag
No Tags, Be the first to tag this record!

Pilkington Library

Availability details from Pilkington Library
Shelfmark: 621.381537/FUJ
Copy number Shelving location Availability
Copy [028389801] Unknown On Shelf

Similar Items