Logic testing and design for testability / Hideo Fujiwara.

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Bibliographic Details
Main Author: Fujiwara, Hideo
Format: Book
Language:English
Published: Cambridge, Mass. ; London : MIT Press, c1985.
Series:MIT Press series in computer systems
Subjects:
Logic circuits > Testing.
Electronic digital computers > Testing.
Logic design.
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Description
Bibliography:Bibliography, p272-278. - Includes index
ISBN:0262060965

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