Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel, Donald R. Beaman.
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| Corporate Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York ; London (etc.) :
Wiley,
1975
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| Series: | Wiley biomedical-health publications
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| Subjects: | |
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